Project

General

Profile

Actions
Copy link

改善 #374

open

【WIP】Wafer管理增加MIT采集标识、Die管理增加Gamma采集标识

Added by 浩宇 詹 about 2 months ago.

Status:
已解决
Priority:
普通
Assignee:
浩宇 詹
Start date:
02/09/2026
Due date:
% Done:

100%

Estimated time:

Description

Wafer管理增加MIT采集标识，采集一次加1

Die管理增加Gamma采集标识，Die采集上来数据就+1

No data to display

Actions
Copy link

Also available in: Atom PDF